A review of night vision metrology is presented in this paper. A set of reasons that create a rather chaotic metrologic situation on night vision market is presented. It is shown that there has been made a little progress in night vision metrology during last decades in spite of a big progress in night vision technology at the same period of time. It is concluded that such a big discrepancy between metrology development level and technology development can be an obstacle in the further development of night vision technology.


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    Titel :

    Review of night vision metrology


    Beteiligte:

    Erschienen in:

    Opto-Electronics Review ; 23 , 2 ; 149-164


    Erscheinungsdatum :

    2015


    Format / Umfang :

    16 Seiten, 64 Quellen




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch


    Schlagwörter :


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