Temperature stable dielectrics with low dielectric losses and high dielectric constant over 75 are key components of capacitors used in high frequency (up to 1GHz) applications such as consumer electronics, cellular phones, filters and so on. The vast majority of such capacitors are made with silver-palladium internal electrodes. With palladium prices exceeding 800 USD per troy ounce (January 2011), it is essential to reduce the palladium content in the electrodes from the traditional 30% down to at least 10%. This requires dielectric materials to be compatible with high silver content electrodes and to be able to sinter at, or below 1000 °C. Moreover, recently adopted Restriction of Hazardous Substances (RoHS) regulations restrict the use of lead, cadmium and four other hazardous materials in manufacturing various types of electronic components, significantly reducing the selection of available dielectric materials on the market. This paper describes two newly developed RoHS compliant very low fired high-K COG dielectrics with dielectric constant over 80 and compares them with two traditional low and very low fired, RoHS and non-RoHS compliant high-K COG dielectrics. Two new RoHS compliant air fired COG dielectric compositions compatible with 90%Ag-10%Pd internal electrodes and having dielectric constant over 80 were developed by MRA Laboratories, Inc.. Comprehensive evaluation of their basic dielectric properties vs. properties of two commercially available analogs revealed that the new materials exhibit comparable dielectric performances at MHz and GHz frequencies, but offer significant advantages in terms of RoHS compatibility, sintering temperature and dielectric reliability. Moreover, the combination of reviewed high temperature properties suggests that these two materials may be used for high temperature applications up to 200°C and beyond, depending on flexibility of electrical circuit board design.


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Two novel very low fired high-K COG dielectrics for high frequency capacitor applications


    Beteiligte:
    Polotai, Anton V. (Autor:in) / Maher, Samir G. (Autor:in) / Wilson, James M. (Autor:in) / Maher, Riad G. (Autor:in)


    Erscheinungsdatum :

    2011


    Format / Umfang :

    14 Seiten, 4 Bilder, 4 Tabellen, 9 Quellen



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    High temperature polymer film dielectrics for aerospace power conditioning capacitor applications

    Venkat, Narayanan / Dang, Thuy D. / Bai, Zongwu et al. | Tema Archiv | 2010


    High-Frequency, High-Power Capacitor

    White, C. W. / Hoffman, P. S. | NTRS | 1985


    Effects of Radiation on Capacitor Dielectrics

    Bouquet, F. L. / Somoano, R. B. / Frickland, P. O. | NTRS | 1987


    Advanced Dielectrics for Pulsed Power Capacitor Devices

    Barshaw, E. / Warnock, F. / Kosai, H. et al. | SAE Technical Papers | 2004


    Environmental Tests of Lithium-Ion Capacitor for Very High Power In-Orbit Applications

    Shimizu, T. / Finnholm, J. / Motohata, T. et al. | British Library Conference Proceedings | 2014