This paper reports on a swept high-frequency eddy current (SHFEC) measurement method developed for electromagnetic nondestructive characterization of residual stresses in shot peened aerospace materials. In this approach, we regard shot-peened surfaces as modified surface layers of varying conductivity, and determine the conductivity deviation profile by inversion of the SHFEC data. The SHFEC measurement system consists of a pair of closely matched printed-circuit-board coils driven by laboratory instrument under software control. This provides improved sensitivity and high frequency performance compared to conventional coils, so that swept frequency EC measurements up to 50 MHz can be made to achieve the smallest skin depth of 80 micron for nickel-based superalloys. We devised a conductivity profile inversion procedure based on the laterally uniform multi-layer theory of Cheng, Dodd and Deeds. The main contribution of this paper is the methodology validation. Namely, the forward and inverse models were validated against measurements on artificial layer specimens consisting of metal films with different conductivities placed on a metallic substrate. The inversion determined the film conductivities which were found to agree with those measured using the direct current potential drop (DCPD) method.
Validation of a residual stress measurement method by swept high-frequency eddy currents
Bewertung einer Eigenspannungsmessmethode durch Hochfrequenz-Wirbelstromabtastung
2007
8 Seiten, 3 Bilder, 2 Tabellen, 15 Quellen
Aufsatz (Konferenz)
Datenträger
Englisch
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