Recent advances in structural integrity evaluation have led to the development of PZT wafer sensors (PWAS) which can be embedded or surface mounted for both acoustic emission (AE) and ultrasonic (UT) modes, which forms an integrated approach for Structural Health Monitoring (SHM) of aerospace structures. For the fabrication of PWAS wafers, soft PZT formulation (SP-5H Grade containing dopants like BA, SM, CA, ZN, Y and HF) were used. The piezoelectric charge constant (d33) was measured by a d33 meter. As a first step towards the final objective of developing Health monitoring methods with embedded PWAS, experiments were conducted on aluminum and composite plates of finite dimensions using PWAS sensors. The AE source was simulated by breaking 0.5 mm pencil lead on the surface of a thin plate. Experiments were also conducted with surface mounted PZT films and conventional AE sensors in order to establish the sensitivity of PWAS. A comparison of results of theoretical and experimental work shows good agreement.


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Embedded PZT wafer sensors for structural health monitoring


    Weitere Titelangaben:

    Eingebettete PZT-Wafersensoren zur strukturellen Zustandsüberwachung


    Beteiligte:
    Gangadharan, R. (Autor:in) / Murthy, C.R.L. (Autor:in) / Bhat, M.R. (Autor:in)


    Erscheinungsdatum :

    2007


    Format / Umfang :

    8 Seiten, 10 Bilder, 8 Quellen





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Datenträger


    Sprache :

    Englisch