As vehicle trends move more towards 'smart' Electrical/Electronics Distribution System, it is possible to replace fuses and mechanical relays with Field Effect Transistors (FET's) to perform both switching and circuit protection functions. Circuit protection utilizing fuses and relays is a well-understood practice, whereas the use of FET's as an overcurrent protection device (OCPD) is relatively new to the industry thus demanding further investigation. To use FET's as an OCPD in automotive environments, I-t curves of the FET and wire have to be compared in at least the minimum and maximum temperatures allowable for the application. This will ensure safe operation throughout the allowable temperature range. This will require detailed testing to produce accurate I-t curves for FET's and wire of all applicable gauges and insulation materials.


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    Titel :

    Temperature effects on wire circuit protection utilizing field effect transistors


    Beteiligte:
    Conner, A.A. (Autor:in) / Strouse, P.R. (Autor:in)


    Erscheinungsdatum :

    2004


    Format / Umfang :

    9 Seiten, 13 Bilder, 5 Quellen




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Temperature Effects on Wire Circuit Protection Utilizing Field Effect Transistors

    Conner, A. A. / Strouse, P. R. / Society of Automotive Engineers | British Library Conference Proceedings | 2004


    Temperature Effects on Wire Circuit Protection Utilizing Field Effect Transistors

    Conner, A. A. / Strouse, P. R. / Society of Automotive Engineers | British Library Conference Proceedings | 2004


    Temperature Effects on Wire Circuit Protection Utilizing Field Effect Transistors

    Conner, Abe A. / Strouse, Paul R. | SAE Technical Papers | 2004


    Temperature effects on wire circuit protection utilizing field effect transistors

    Conner,A.A. / Strouse,P.R. / Yazaki North America,US | Kraftfahrwesen | 2004