The emitted polarization signature of materials is of interest for use in discriminating targets from cluttered backgrounds. In addition, spectrally varying polarization signatures might be used for material identification or to separate target and environment radiance contributions. A spectrally filtered LWIR imaging polarimeter has been constructed and used in the lab and in the field to make signature measurements of controlled targets. In addition, a full-Stokes FTIR polarization spectrometer) has been constructed for higher spectral resolution measurements of materials. This paper discusses the instruments, calibration methods, general operation, and results characterizing the emitted polarization properties of materials as a function of wavelength.


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    Titel :

    Spectral polarization signatures of materials in the LWIR


    Beteiligte:
    Fetrow, M.P. (Autor:in) / Sposato, S.H. (Autor:in) / Bishop, K.P. (Autor:in) / Caudill, T.R. (Autor:in)


    Erscheinungsdatum :

    2000


    Format / Umfang :

    12 Seiten, 10 Quellen




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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