Cosmic-ray soft errors from ground level to aircraft flight altitudes are caused mainly by neutrons. We derived an empirical model for estimation of soft error rate (SER). Test circuits were fabricated in a standard 0.6- mu m CMOS process. The neutron SER dependence on the critical charge and supply voltage was measured. Time constants of the noise current were extracted from the measurements and compared with device simulations in three dimensions. The empirical model was calibrated and verified by independent SER measurements. The model is capable of predicting cosmic-ray neutron SER of any circuit manufactured in the same process as the test circuits. We predicted SER of a static memory cell.
Cosmic-ray soft error rate characterization of a standard 0.6- mu m CMOS process
IEEE Journal of Solid-State Circuits ; 35 , 10 ; 1422-1429
2000
8 Seiten, 18 Quellen
Aufsatz (Zeitschrift)
Englisch
Halbleiterfertigung: Standard-55-nm-CMOS-Prozess
British Library Online Contents | 2006
Soft Error Mitigation in Soft-Core Processors
Springer Verlag | 2016
|CMOS standard cell in the automotive industry
Kraftfahrwesen | 1987
|Cosmic Ray Single Event Rate Calculations
Wiley | 2011
|