Cosmic-ray soft errors from ground level to aircraft flight altitudes are caused mainly by neutrons. We derived an empirical model for estimation of soft error rate (SER). Test circuits were fabricated in a standard 0.6- mu m CMOS process. The neutron SER dependence on the critical charge and supply voltage was measured. Time constants of the noise current were extracted from the measurements and compared with device simulations in three dimensions. The empirical model was calibrated and verified by independent SER measurements. The model is capable of predicting cosmic-ray neutron SER of any circuit manufactured in the same process as the test circuits. We predicted SER of a static memory cell.


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Cosmic-ray soft error rate characterization of a standard 0.6- mu m CMOS process


    Beteiligte:
    Hazucha, P. (Autor:in) / Svensson, C. (Autor:in) / Wender, S.A. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    2000


    Format / Umfang :

    8 Seiten, 18 Quellen




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch




    Halbleiterfertigung: Standard-55-nm-CMOS-Prozess

    British Library Online Contents | 2006


    Soft Error Mitigation in Soft-Core Processors

    Martínez-Álvarez, Antonio / Cuenca-Asensi, Sergio / Restrepo-Calle, Felipe | Springer Verlag | 2016


    CMOS standard cell in the automotive industry

    Hobbs,E.D. / Motorola,GB | Kraftfahrwesen | 1987


    Cosmic Ray Single Event Rate Calculations

    Petersen, Edward | Wiley | 2011