During the procurement of a CMOS RAM memory hybrid for use in a long term, high reliability space application, problems were encountered with regard to the quality and reliability of memory CMOS dice delivered to the hybrid manufacturer. The problems encountered concern the areas of step coverage metallization, susceptibility to latchup, cosmic ray susceptibility, and pattern and voltage sensitivity. As a result, reliability assessments and extensive in-depth failure analysis were performed and program model philosophy changes had to be instituted which ultimately resulted in the use of a replacement CMOS memory chip produced in Japan.
Problems and considerations for the procurement of a 54K bit CMOS RAM memory hybrid for long-term high-reliability space application
Schwierigkeiten und Ueberlegungen bei der Beschaffung eines 54kbit CMOS RAM Hybridspeichers fuer einen zuverlaessigen Langzeitbetrieb im All
2nd ESA product assurance sympos. ; 159-165
1982
7 Seiten, 15 Bilder, 3 Tabellen, 9 Quellen
Aufsatz (Konferenz)
Englisch
RAUMFAHRT , RAUMFAHRTTECHNIK , INTEGRIERTE HYBRIDSCHALTUNG , BESCHAFFUNGSWESEN , DATENSPEICHER , DIGITALE INTEGRIERTE SCHALTUNG , CMOS-SCHALTUNG , RAM (DIREKTZUGRIFFSSPEICHER) , LANGZEITVERHALTEN , KOSMISCHE STRAHLUNG , SYSTEMZUVERLAESSIGKEIT , ZUGRIFFSZEIT , FEHLERORTUNG , SPEICHERZELLE , SPEICHERDICHTE
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