R. G. Benetts: The philosophy of testing digital systems: a pragmatic approach (1.1-1.6). --M. Small; D. Murray: A quality model of manufacturing and test processes (2.1-2.15). --J. P. Talbot; J. Page: The testing of digital systems in the aviation electronics industry (3.1-3.10). --E. M. Scott; I. R. Crowcombe: Minimum cost testing (4.1-4.7)


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    Titel :

    ATE seminar on 'The Philosophy of testing digital systems', Dec. 3 1980, London, GB


    Weitere Titelangaben:

    ATE Seminar ueber 'Pruefverfahren an Digitalsystemen', 3. Dez. 1980, GB


    Erscheinungsdatum :

    1980


    Format / Umfang :

    38 Seiten


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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