This paper presents a results orientated case history of the Reliability Program for the Load Computing Optical Sigut System (LOSS) for the Northrop F-5E-Aircraft. The program was started in 1973 with a development test and evaluation program for demonstrate the reliability of the system. The first production hardware was delivered in 1975. Reliability integrity has been maintained and verified throughout the production hardware cycle over the ensuing years by successful reliability testing of 192 systems. Field availability has been high and life very costs of the F-5 LCOSS have been low due to its excellent performance in the field. The paper describes in detail the systematically structured three-phased reliability program from the contractor's viewpoint. Emphysis from the is placed on reqiurements, methods, results, and decisions associated with the F-5 LCOSS Reliability Program from March, 1973. through October 15, 1979. The three test phases, Reliability Demonstration Test (RDT), Production Reliability Verification Test (PaVT) and Production Reliability Test (PRT), will be discussed in detail. Field results and relative program costs are also presented.
Reliability pays off
Zuverlaessigkeit macht sich bezahlt
Microelectronics and Reliability ; 20 , 1/2 ; 101-108
1980
8 Seiten, 11 Bilder, 9 Tabellen, 7 Quellen
Aufsatz (Zeitschrift)
Englisch
SYSTEMZUVERLAESSIGKEIT , KOSTEN , HARDWARE , AUSFALL , SICHTGERAET , FLUGZEUG , TESTPROGRAMM , DISPLAY , PRODUKTION
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