This paper presents the results of an experimental evaluation of neutron damage in phase shifter circuits (i.e., Microwave Integrated Circuits, MIC) utilizing pin diodes as switches. Microwave phase shifter fixtures containing pin diodes as well as discrete experimental diodes have been irradiated by 14-MeV neutrons, 1-MeV neutrons, and Cobalt-60 gammas. This paper discusses the decrease in lifetime and insertion losses, and presents lifetime damage constants. The experimental diodes have been found to be resistant to insertion-loss increase after neutron bombardment despite a severe degradation of the initial lifetimes. It appears that samples with an intrinsic width of 56 microm and an initial lifetime of 6 micros are capable of exposure to fluences approaching 10(exp13)n/cm(exp2) (1-MeV equilvanet) with an insertion-loss increase of only 0.66 dB.
Neutron damage in PIN diode phase shifters for radar arrays
Neutronenschaedigung bei PIN-Dioden Phasenschieber fuer Radar-Systeme
IEEE Transactions on Nuclear Science ; 25 , 6/Dec. ; 1528-1533
1978
6 Seiten, 6 Bilder, 4 Tabellen, 7 Quellen
Aufsatz (Zeitschrift)
Englisch
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