Abstract Coherent soft x-ray laser speckle has been examined to study the microdomain structures of relaxor ferroelectric 0.91PZN—09PT. Microdomains with nanometer size of about 400 nm were identified precisely. Temperature variation and electric field variation of the micro domain were characterized by a kind of foot print method with high sensitivity of a percent order.


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    Titel :

    High Sensitive Characterization of Microdomain Structures in PZN-PT (91/09) by Means of Coherent Soft X-Ray Laser Speckle


    Beteiligte:
    Namikawa, K. (Autor:in) / Tai, R. Z. (Autor:in) / Matsushita, M. (Autor:in) / Ohwada, K. (Autor:in) / Kishimoto, M. (Autor:in)

    Erschienen in:

    X-Ray Lasers 2008 ; 7 ; 373-380


    Erscheinungsdatum :

    2009-01-01


    Format / Umfang :

    8 pages





    Medientyp :

    Aufsatz/Kapitel (Buch)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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