Failure analysis (FA) could provide timely feedback to process optimization and solution paths for system failures; thus, it is critical for the development of advanced driver assistance systems (ADAS). In this chapter, failure analysis flows starting from systems or boards until components or packages and dice are introduced. Electrical fault isolation (FI) techniques designed to locate subtle defects inside complicated semiconductor devices are reviewed. Physical failure analysis approaches adopted to provide artifact free nanometer scale analysis are discussed. Material analysis methods assisting in thorough root cause investigation are presented. Non-destructive and high-resolution imaging tools with the potential of significantly shortening failure analysis through put time are demonstrated. Case studies are used to illustrate strategies and methodologies in ADAS failure analysis.


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Failure Analysis in Advanced Driver Assistance Systems


    Beteiligte:
    Li, Yan (Herausgeber:in) / Shi, Hualiang (Herausgeber:in) / Li, Yan (Autor:in) / Shi, Hualiang (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    2022-10-28


    Format / Umfang :

    45 pages




    Medientyp :

    Aufsatz/Kapitel (Buch)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




    Advanced Driver Assistance Systems

    Paul, Aneesh / Baruah, Mriganka / Srivastava, Rituraj et al. | SAE Technical Papers | 2016


    Advanced Driver Assistance Systems

    Rob E.C.M. van der Heijden / Vincent A.W.J. Marchau | DOAJ | 2005

    Freier Zugriff

    Advanced Driver Assistance Systems

    Hilgers, Michael / Achenbach, Wilfried | Springer Verlag | 2021


    Advanced Driver Assistance Systems

    Haas, Roland Erik / Bhattacharjee, Shambo / Möller, Dietmar P. F. | Springer Verlag | 2019


    Advanced Driver Assistance Systems (ADAS)

    Antony, Maria Merin / Whenish, Ruban | Springer Verlag | 2021