Abstract Many semiconductor electronic technologies (such as Silicon CMOS and Gallium Arsenide HEMT) and High Temperature Superconducting (HTS) electronic devices offer significantly enhanced performance at cryogenic temperatures compared to ambient temperature operation. There have been few commercial or industrial products that exploit cryogenic temperature operation due to the cost and reliability of cryocooling system. To address this cryocooling need, the DARPA Low Cost Cryocooler Program has supported the development of a number of low cost, long life cryocoolers. The development goal in this program is to provide cooling capacity (that is required for a specific commercial application) with a minimum 3 year life at one thousand dollar cost target for a ten thousand unit per year production. Six types of cryocoolers were supported by this effort. One from each of the following vendors: Superconductor Technologies Inc., CTI, APD Cryogenics, CryoMech Inc., Raytheon (formerly Hughes Aircraft) and MMR Technologies, Inc. Demonstration systems from each of these vendors have been delivered to the Naval Research Laboratory and the testing of these systems has begun during the past year. In order to verify the performance of these new cryocoolers, the Naval Research Laboratory has established a long life cryocooler testing facility. Cryocooler performance parameters such as cryogenic thermal load, cold finger temperature, cryocooler input wall power and cryocooler rejection temperature are instrumented. Pertinent ambient conditions such as ambient room temperature and cold finger vacuum levels are also instrumented. An automated data acquisition system, utilizing a PC with Lab View software, is used to monitor, control, and archive cooler performance data. Approximately one year of testing has been completed on the first cryocoolers delivered under the Defense Advanced Research Projects Agency (DARPA) LCC program to date. A brief overview of the coolers under test is presented as well as selected test results. An overview of the existing test facility and future plans is presented.


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    Titel :

    DARPA Low Cost Cryocooler Performance Testing: Preliminary Results


    Beteiligte:
    Kawecki, T.G. (Autor:in) / James, S. C. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    2002-01-01


    Format / Umfang :

    12 pages




    Medientyp :

    Aufsatz/Kapitel (Buch)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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