This paper discusses a new method for performing wavelet-based pattern recognition and feature extraction. Known as 'progressive pattern recognition,' this approach is based on performing a subband transform of a target image and then performing partial correlations with different subband resolutions; it is possible to recognize the image without correlating against the complete wavelet transform, thereby realizing considerable savings in computational time. Computer simulations of palm print recognition are presented, and extensions to both scale and rotation invariant systems and optical implementations are discussed.


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    Titel :

    Wavelet image processing for optical pattern recognition and feature extraction


    Beteiligte:

    Kongress:

    10th Meeting on Optical Engineering in Israel ; 1997 ; Jerusalem,Israel


    Erschienen in:

    Erscheinungsdatum :

    1997-09-22





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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