A test program using thirty production 1980 California “X” cars equipped with Computer Command Control emission control systems was run to compare the emission-related defect detection ability of end-of-line short emission tests and non-emission (or functional) tests. In this comparison, the non-emission tests detected 91% of the defects implanted, while the short emission tests detected only 64% of the defects. Further development of non-emission tests would further improve their defect detection capability, while little can be done to improve the defect detection capability of short emission tests.
The Defection of Emission Related Defects on Future Vehicles - Which Assembly Line Test Is Most Effective?
Sae Technical Papers
West Coast International Meeting and Exposition ; 1981
1981-08-01
Aufsatz (Konferenz)
Englisch
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