A test program using thirty production 1980 California “X” cars equipped with Computer Command Control emission control systems was run to compare the emission-related defect detection ability of end-of-line short emission tests and non-emission (or functional) tests. In this comparison, the non-emission tests detected 91% of the defects implanted, while the short emission tests detected only 64% of the defects. Further development of non-emission tests would further improve their defect detection capability, while little can be done to improve the defect detection capability of short emission tests.


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    Titel :

    The Defection of Emission Related Defects on Future Vehicles - Which Assembly Line Test Is Most Effective?


    Weitere Titelangaben:

    Sae Technical Papers


    Beteiligte:
    Drake, D. A. (Autor:in) / Roelant, E. J. (Autor:in) / Blass, G. F. (Autor:in) / Calhoun, J. C. (Autor:in) / Mirkhani, K. (Autor:in)

    Kongress:

    West Coast International Meeting and Exposition ; 1981



    Erscheinungsdatum :

    1981-08-01




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch







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