The scope of this document is to: 1 Specify techniques to detect SC parts using electrical testing. 2 Provide various levels of electrical testing that can be used by the User to define test plans for detecting SC parts. 3 Provide minimum requirements for testing laboratories so that User/Requester can determine which test houses have the necessary capabilities. (For example: technical knowledge, equipment, procedures and protocols for performing electrical testing for verification analysis.) Note: User/Requester is defined in AS6171 General Requirements 4 Specify Burn-In and environmental tests. The environmental tests include Temperature Cycling for Active Devices and Thermal Shock for Passive Devices. Seal Tests are described and recommended for hermetic devices. The following terminology is used throughout this document: a Shall = is mandatory; b Should = is recommended; and c Will = is planned (is considered to be part of a standard process). If AS6171/7 is invoked in the contract, the base document, AS6171 General Requirements shall also apply. This document provides guidance and requirements on the electrical test procedures to be employed by the Test Laboratory (Lab) for electrical, electronic and electro-mechanical (EEE) parts for suspect counterfeit (SC) part detection. The level of testing should be derived by the User Organization working in conjunction with the Test Lab, taking into consideration the risk level as defined in the SC part detection test sequence specified herein. It shall be the responsibility of the Test Lab to conduct the electrical test following the sequence of test and inspections for a given risk level specified herein. Reporting procedures shall be defined on how to handle anomalous or failed parts and the reporting protocol on how to detect counterfeit parts. The creation of this document is a step in addressing the ever-increasing global problem of EEE parts counterfeiting. AS6171/7 has been reaffirmed to comply with the SAE Five-Year Review policy.


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    Titel :

    Techniques for Suspect/Counterfeit EEE Parts Detection by Electrical Test Methods


    Erscheinungsdatum :

    2022-06-28



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch