This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers. The committee reviewed this information report and determined that no substantial changes were needed. The reference section was reformatted and updated.
Test Device Head Contact Duration Analysis
2011-01-05
Aufsatz (Konferenz)
Englisch
Test Device Head Contact Duration Analysis
SAE Technical Papers | 2016
Test Device Head Contact Duration Analysis
SAE Technical Papers | 2005
TEST DEVICE HEAD CONTACT DURATION ANALYSIS
SAE Technical Papers | 1990
TEST DEVICE HEAD CONTACT DURATION ANALYSIS
SAE Technical Papers | 1997
Effect of Long-Duration Impact on Head
SAE Technical Papers | 1972
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