This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers. The committee reviewed this information report and determined that no substantial changes were needed. The reference section was reformatted and updated.


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    Titel :

    Test Device Head Contact Duration Analysis


    Erscheinungsdatum :

    2011-01-05



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch








    Effect of Long-Duration Impact on Head

    Thomas, L M. / Hodgson, V. R. | SAE Technical Papers | 1972