An adequate qualification of concentrator photovoltaic solar cells and cell‐on‐carriers is essential to increase their industrial development. The lack of qualification tests for measuring their reliability together with the fact that conventional accelerated life tests are laborious and time consuming are open issues. Accordingly, in this paper, we propose a semi‐quantitative temperature‐accelerated life test to qualify solar cells and cell‐on‐carriers that can assure a minimum life when failure mechanisms are accelerated by temperature under emulated nominal working conditions with an activation energy >0.9 eV. A properly designed semi‐quantitative accelerated life test should be able to determine if the device under test will satisfy its reliability requirements with an acceptable uncertainty level. The applicability, procedure, and design of the proposed test are detailed in the paper. Copyright © 2015 John Wiley & Sons, Ltd. This work proposes guidelines to develop a temperature‐accelerated life test emulating operating conditions that can guarantee, with an acceptable uncertainty level, a given warranty period under thermal stress. The procedure is simple and short in order to have an estimation of the reliability for any kind of concentrator solar cell/CoC architecture.


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Semi‐quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers



    Erschienen in:

    Erscheinungsdatum :

    2015




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch



    Klassifikation :

    BKL:    53.36 Energiedirektumwandler, elektrische Energiespeicher