Post-exposure flight data on BJTs are analyzed with a Silvaco model to extract interface traps.


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    Titel :

    Radiation-Induced Defects in BJTs on NASA ELDRS Space Experiment


    Beteiligte:
    Adalin R Benedetto (Autor:in) / C Cook (Autor:in) / M J Campola (Autor:in) / S Roark (Autor:in) / A Tender (Autor:in) / H J Barnaby (Autor:in)

    Kongress:

    38th Hardened Electronics and Radiation Technology (HEART) Conference ; 2022 ; Tarrytown, NY, US


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Keine Angabe


    Sprache :

    Englisch




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