Commercialization of a competitive reusable launch vehicle (RLV) is a primary goal for both NASA and the U.S. aerospace industry. To expedite achievement of this goal, the Bantam-X Technology Program is funding development of innovative technologies to lower costs for access to space. Ground operations is one area where significant cost reduction is required. For the Shuttle fleet, ground operations account for over 80% of the life cycle costs, and TPS recertification accounts for 27% of the operation costs ($4.5M per flight). Bantam Task TPS-7, Subsurface Microsensors for Assisted Recertification of TPS (SmarTPS), is a joint effort between NASA centers and industry partners to develop rapid remote detection and scanning technology for inspection of TPS and detection of subsurface defects. This short paper will provide a general overview of the SmarTPS concept.


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    Titel :

    Subsurface Microsensors for Assisted Recertification of TPS (SmarTPS)


    Beteiligte:
    Pallix, Joan B. (Autor:in) / Milos, Frank S. (Autor:in) / Huestis, Dave (Autor:in) / Arnold, James O. (Autor:in)

    Kongress:

    Sixth International Conference on Composites Engineering ; 1999 ; Orlando, FL, United States


    Erscheinungsdatum :

    1999-01-01


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


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