Fatigue-testing system includes automated subsystem continuously tracking location of fatigue-crack tip in metal or other highly electrically conductive specimen. Fatigue-crack-tip-locating subsystem also searches specimen to find initial fatigue crack and its tip and to trace out hidden fatigue cracks and other flaws inside specimen. Subsystem operates under overall control of personal computer, which also controls load frame applying prescribed cyclic stresses to specimen. Electromagnetic flaw detector based on eddy-current principle scanned over surface of specimen. Flaw detector described in "Electromagnetic Flaw Detector Is Easier To Use" (LAR-15046). System provides automated control and monitoring of fatigue experiments, saving time for researchers and enabling experiments to run unattended 24 hours a day. All information on crack-tip trajectories and rates of growth of cracks recorded automatically, so researchers have access to more information.
Fatigue-Crack-Tip Locator
NASA Tech Briefs ; 18 , 12
1994-12-01
Sonstige
Keine Angabe
Englisch
Online Contents | 1994
Online Contents | 2002
Online Contents | 2002
Online Contents | 2001