A constant current charge technique for low earth orbit testing of nickel cadmium cells is presented. The method mimics the familiar taper charge of the constant potential technique while maintaining cell independence for statistical analysis. A detailed example application is provided and the advantages and disadvantages of this technique are discussed.


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    Titel :

    A constant current charge technique for low Earth orbit life testing


    Beteiligte:
    Glueck, Peter (Autor:in)


    Erscheinungsdatum :

    1991-05-01


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Keine Angabe


    Sprache :

    Englisch




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