Interferometric method is used to measure small changes in size of optical materials. Error introduced with optical phase shifts occurring with time is overcome by using parts of Fabry-Perot resonators with unequal lengths. Both stability of optical phase shifts upon reflection from multilayer stacks and dimensional stability of optical contacts is measured.
Precision measurement of changes in physical dimensions
NASA Tech Briefs ; 1 , 4
1977-03-01
Sonstige
Keine Angabe
Englisch
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