Outgassing, deposition, and desorption kinetics of silicone compounds, are examined as examples of optical surface contaminants of spacecraft windows. Their behavior in a space environment after exposure to ultraviolet radiation is also examined. The use of internal reflection spectroscopy is shown to provide a viable means of real-time, in-situ identification of contaminants of orbiting spacecraft. The instrumental techniques are proposed as the basis of further investigations and the development of flight hardware. (Author)


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    Titel :

    Results of an Analytical Study of Spacecraft Deposition Contamination by Internal Reflection Spectroscopy


    Beteiligte:
    T. Mookherji (Autor:in)

    Erscheinungsdatum :

    1976


    Format / Umfang :

    33 pages


    Medientyp :

    Report


    Format :

    Keine Angabe


    Sprache :

    Englisch





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