This bibliography contains citations concerning the reliability or fatigue life of electronic circuits subjected to temperature cycling in an environmental chamber. Applications in military aircraft and spacecraft electronic equipment are examined. Reliability testing devices are discussed relative to performance evaluations and utilization. (This updated bibliography contains 294 citations, 71 of which are new entries to the previous edition.)
Integrated Circuits Reliability. June, 1974-May, 1984 (Citations from the International Aerospace Abstracts Data Base)
1984
237 pages
Report
Keine Angabe
Englisch