This bibliography contains citations concerning the reliability or fatigue life of electronic circuits subjected to temperature cycling in an environmental chamber. Applications in military aircraft and spacecraft electronic equipment are examined. Reliability testing devices are discussed relative to performance evaluations and utilization. (This updated bibliography contains 294 citations, 71 of which are new entries to the previous edition.)


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen


    Exportieren, teilen und zitieren



    Titel :

    Integrated Circuits Reliability. June, 1974-May, 1984 (Citations from the International Aerospace Abstracts Data Base)


    Erscheinungsdatum :

    1984


    Format / Umfang :

    237 pages


    Medientyp :

    Report


    Format :

    Keine Angabe


    Sprache :

    Englisch