Total ionizing dose and displacement damage testing is performed to characterize and determine the suitability of candidate electronics for NASA spacecraft and program use.


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    Titel :

    Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA


    Beteiligte:
    Campola M. J. (Autor:in) / Cochran D. J. (Autor:in) / O'Bryan M. V. (Autor:in) / Lauenstein J. (Autor:in) / Violette D. (Autor:in) / Xapsos M. A. (Autor:in) / Boutte A. J. (Autor:in) / Chen D. (Autor:in) / Gigliuto R. A. (Autor:in) / LaBel K. A. (Autor:in)

    Erscheinungsdatum :

    2015


    Format / Umfang :

    9 pages


    Medientyp :

    Report


    Format :

    Keine Angabe


    Sprache :

    Englisch




    Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

    Cochran, Donna J. / Buchner, Stephen P. / Chen, Dakai et al. | IEEE | 2009


    Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

    Cochran, Donna J. / Chen, Dakai / Oldham, Timothy R. et al. | NTRS | 2010


    Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

    Campola, Michael J. / Cochran, Donna J. / Boutte, Alvin J. et al. | NTRS | 2015