This paper is concerned with optoelectronics physics to design and analyze double chirped mirrors (DCM). The aim is to reduce the ripples through the multilayer's stacks and push the limits of pulse duration to reach femtosecond scale. So, from the very early days of quantum mechanics, physicists have tried to understand the properties of chirped mirror in TE polarization using Wentzel-Kramers-Brillouin (WKB) method. The optoelectronics field has experienced a rapid development during the last decade. The objective of this paper is to investigate and develop measurement methods and instruments for measuring important parameters of the components used in femtosecond field. A simple chirped mirror (CM) can be achieved through dielectric coating with alternate layers of high and low index materials such as Ta2O5/SiO2 with varying thicknesses. The basic idea of the chirped mirrors is that a wave packet of a given center wavelength is most efficiently reflected by a corresponding quarter wave stack. Therefore, if multiple layers with linearly varying thicknesses are deposited on a substrate, longer wavelengths penetrate into the structure and will consequently experience more group delay (GD) when reflected back from the mirror. As a result, negative group delay dispersion (GDD) will be produced.


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    Titel :

    Analytic design of dielectric multilayer thin films chirped mirrors




    Erscheinungsdatum :

    2013-06-01


    Format / Umfang :

    1075750 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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