We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique.


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    Titel :

    Novel spatial scanning technique for surface roughness measurement


    Beteiligte:
    Xie, F. (Autor:in) / Zhang, W. (Autor:in) / Jiang, X.Q. (Autor:in) / Zhang, L. (Autor:in) / Bennion, I. (Autor:in)


    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    121639 byte





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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