Infra-red images were captured by a Si-CCD image sensor. The Si-CCD showed quadratic sensitivity characteristics due to the two-photon absorption process for high intensity light with a wavelength of 1550 nm.
Infra-red image detection with a Si-CCD image sensor due to the two-photon absorption process
2001-01-01
113488 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Infra-Red Image Detection with a Si-CCD Image Sensor due to the Two-Photon Absorption Process
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