Femtosecond laser ablation studies of silicon with and without the native oxide on the surface were conducted in an ultrahigh vacuum environment. SEM results show a clear difference in the laser intensity threshold for ablation.
The role of the native oxide on silicon in femtosecond laser damage threshold studies at grazing incidence
Conference on Lasers and Electro-Optics, 2004. (CLEO). ; 1 ; 3 pp. vol.1
2004-01-01
436331 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Double Grazing Incidence Pulsed Dye Laser
British Library Conference Proceedings | 1994
|Analysis on the damage threshold of MgO:LiNbO3 crystals under multiple femtosecond laser pulses
British Library Online Contents | 2016
|Analysis on the damage threshold of MgO:LiNbO3 crystals under multiple femtosecond laser pulses
British Library Online Contents | 2016
|Analysis on the damage threshold of MgO:LiNbO3 crystals under multiple femtosecond laser pulses
British Library Online Contents | 2016
|Analysis on the damage threshold of MgO:LiNbO3 crystals under multiple femtosecond laser pulses
British Library Online Contents | 2016
|