Abstract This paper presents a long-term study on radiation effects in non-hardened high density memory devices operating within the main on-board computer system of the Algerian microsatellite Alsat-1 in Low Earth Orbit (LEO). A statistical analysis of single-event upset (SEU) activity is presented for commercial SRAM devices, and their response to extreme solar events shows SEU rate significant increases correlated with high-energy protons (E >100MeV). Ground based neutron monitor data are used to illustrate the long-term correlation between galactic cosmic rays and Alsat-1 upsets. The short-term effects of energetic solar particles are illustrated with space environment data from GOES-11. The Alsat-1 observed SEU rates are compared to the predicted rates based on ground test data and environment models. The prediction results are in good agreement with in-flight data.


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Analysis of radiation induced effects in high-density commercial memories on-board Alsat-1: The impact of extreme solar particle events


    Beteiligte:

    Erschienen in:

    Advances in Space Research ; 55 , 12 ; 2820-2832


    Erscheinungsdatum :

    2015-02-25


    Format / Umfang :

    13 pages




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch