Abstract A data base of experimental N(h) profiles has been obtained for some 3000 ionograms recorded at a network of stations at high, middle and low latitudes in the Northern and Southern hemispheres. The data base consists of ionograms and electron density profiles for even hours of Universal Time at the Regular World Days for four seasons during 1976 and 1980 referring to minimum and maximum of solar activity. From the results of N(h) profile calculations, the semithickness parameters, Y0.5F2 and Y0.7F1, of the ionospheric F1 and F2 layers have been determined from which the standard electron concentration profiles of the bottomside F region have been obtained. From the data, relationships are developed between the interlayer E-F valley width and the F2 layer sub-peak semithickness.


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    Titel :

    Standard N(h) profiles in the sub-peak F region from ground-based sounding of the ionosphere


    Beteiligte:

    Erschienen in:

    Erscheinungsdatum :

    1988-01-01


    Format / Umfang :

    4 pages




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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