AbstractFor the success of NASA’s new vision for space exploration to Moon, Mars and beyond, exposures from the hazards of severe space radiation in deep space long duration missions is ‘a must solve’ problem. The payload penalty demands a very stringent requirement on the design of the spacecrafts for human deep space missions. The exploration beyond low Earth orbit (LEO) to enable routine access of space will require protection from the hazards of the accumulated exposures of space radiation, Galactic Cosmic Rays (GCR) and Solar Particle Events (SPE), and minimizing the production of secondary radiation is a great advantage. There is a need to look to new horizons for newer technologies. The present investigation revisits electrostatic active radiation shielding and explores the feasibility of using the electrostatic shielding in concert with the state-of-the-art materials shielding and protection technologies. The full space radiation environment has been used, for the first time, to explore the feasibility of electrostatic shielding. The goal is to repel enough positive charge ions so that they miss the spacecraft without attracting thermal electrons. Conclusions are drawn for the future directions of space radiation protection.


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Electrostatic space radiation shielding


    Beteiligte:

    Erschienen in:

    Advances in Space Research ; 42 , 6 ; 1043-1049


    Erscheinungsdatum :

    2007-09-16


    Format / Umfang :

    7 pages




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




    Electrostatic space radiation shielding

    Tripathi, Ram K. | Online Contents | 2008




    Configuration studies for active electrostatic space radiation shielding

    Joshi, Ravindra P. / Qiu, Hao / Tripathi, Ram K. | Elsevier | 2013


    Electrostatic active radiation shielding - revisited

    Tripathi, R.K. / Wilson, J.W. / Youngquist, R.C. | IEEE | 2006