The safety of railway operation is influenced by the possibility of the occurrence of technical and human errors. One possibility for evaluating human errors is an analysis of accident descriptions from hazardous events. Within this method, the user can identify the underlying influential factors by analyzing the separate events. As a basis for the evaluation, all events appearing on a large network could be considered, the sample is very large. However, this must not lead to significant results, inevitably. Instead, it has to be questioned if a large railway network features different properties which may influence the occurrence of a human error. This could be infrastructural as well as operational parameters, for example. A change within one of the parameters could lead to a change of the error occurrence or rather a modified range of a specific performance shaping factor. It is also possible to choose a selection of the events that should be considered for the evaluation or rather to filter the events on specific parameters. The article discusses the shift of contributing factors if different operational and infrastructural properties are assumed as a basis for the evaluation.


    Zugriff

    Download

    Verfügbarkeit in meiner Bibliothek prüfen


    Exportieren, teilen und zitieren



    Titel :

    The influence of selecting a specific sample of hazardous events on the evaluation of the train driver's reliability


    Beteiligte:
    Lindner, Tobias (Autor:in) / Universitätsbibliothek Braunschweig (Gastgebende Institution)

    Erscheinungsdatum :

    2013



    Medientyp :

    Sonstige


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



    Klassifikation :

    DDC:    625





    Train driver's manual

    Maggs, Colin Gordon | SLUB | 2014


    DRIVER'S DESK OF RAIL TRAIN, AND RAIL TRAIN

    ZHANG LI / YANG ZHIYUE / JI ENXIANG et al. | Europäisches Patentamt | 2022

    Freier Zugriff

    Detection of driver’s hazardous situation using coarse far-infrared image

    Miki Nakayama, / Shunji Katahara, / Masayoshi Aoki, | IEEE | 2008