The thermal design of detector in a solar X-ray and extreme ultraviolet imager is performed according to the specific requirements for the temperature of its optical system. First, the detector structure and the thermal control index are introduced. Second, the external heat fluxes of the imager is analyzed, and the position of the heat dissipation surface is confirmed. Then, the factors that influence the temperature of the charge-coupled device are analyzed. Large-thermal-resistance insulating technology is adopted, and a detailed thermal design scheme is proposed based on the difficulty of the thermal design. A thermal analysis model is constructed using thermal model generator software. Finally, a thermal balance test is performed in a vacuum environment. Simulation results show that the temperature of the charge-coupled device ranges from 69.7 to 61.3 ° C , which meets the thermal control index requirements. Test results indicate that the charge-coupled device temperature range from 69.3 to 62.2 ° C , which also satisfies the design requirements. Additionally, the test values are in good agreement with the calculated results, which verify that the thermal design is appropriate.


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    Titel :

    Thermal Design of Detector for the Solar X-Ray and Extreme Ultraviolet Imager


    Beteiligte:
    Li, Shijun (Autor:in) / Chen, Liheng (Autor:in) / Wu, Yuhua (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    2018-10-29


    Format / Umfang :

    7 pages




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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