Effect of Pin-to-Case Electrostatic Discharge on Electroexplosive Zdeice Insulation Resistance
J. Hansen, C. Lord, L. Yang, M. Simpson, K. S. Orme
Journal of Spacecraft and Rockets ; 43 , 5 ; 1084-1092
2006-01-01
9 pages
Aufsatz (Zeitschrift)
Elektronische Ressource
Englisch
Effect of Pin-to-Case Electrostatic Discharge on Electroexplosive Device Insulation Resistance
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