High-Resolution Measurement of Resonant Wave Patterns by Perturbing the Evanescent Field Using a Nanosized Probe in a Transmission Scanning Near-Field Optical Microscopy Configuration
JOURNAL OF LIGHTWAVE TECHNOLOGY ; 25 , 7 ; 1811-1818
2007-01-01
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC: | 621.3692 |
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