The Development of a Silicon-Drift-Detector-Based X-Ray Spectrometer for Remote Surface Analysis
12th, International Conference on Engineering, Science, Construction, & Operations in Challenging Environments ; 2010 ; Honolulu, HI
International Conference on Engineering, Science, Construction, & Operations in Challenging Environments ; 1450-1458
2010-01-01
9 pages
Includes bibliographical references
Aufsatz (Konferenz)
Englisch
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