P8.10 Analysis of STI Thin-SOI LDMOS transistors for Smart Power and high frequency applications
5th, International conference on integrated power electronics systems ; 2008 ; Nuremberg, Germany
2008-01-01
8 pages
Also held on CD-ROM
Aufsatz (Konferenz)
Englisch
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
In situ Defect-screening of Integrated LDMOS for Critical Automotive Applications
Tema Archiv | 2010
|British Library Conference Proceedings | 2010
|"Ldmos Safe Operating Area - System and Application Needs"
British Library Conference Proceedings | 2000
|HF-Halbleiter: Im HF-Technologie-Rennen: GaN und LDMOS
British Library Online Contents | 2006