TuC4.2 Loss Characterization in Micro-Cavities using the Thermal Bistability Effect
WGM microcavities ; 2004 ; San Diego, Calif
2004-01-01
2 pages
IEEE cat. no. 04TH8728. Held as part of the 2004 IEEE/LEOS Summer topical meeting
Aufsatz (Konferenz)
Englisch
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