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    Titel :

    Analysis and potentialities of backside-illuminated thinned CMOS imagers [5251-22]



    Kongress:

    Conference, Detectors and Associated Signal Processing ; 2003 ; St. Etienne, France



    Erscheinungsdatum :

    2004-01-01


    Format / Umfang :

    9 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Thinned, Backside-Illuminated Area CCD Imager for Electron Detection

    Debusschere, I. | British Library Online Contents | 1992


    Fast MTF measurement of CMOS imagers using ISO 12233 slanted-edge methodology [5251-29]

    Estribeau, M. / Magnan, P. / Society of Photo-optical Instrumentation Engineers | British Library Conference Proceedings | 2004


    New package for CMOS sensors [5251-27]

    Diot, J.-L. / Loo, K. W. / Moscicki, J.-P. et al. | British Library Conference Proceedings | 2004


    Backside illuminated CMOS image sensors optimized by modeling and simulation

    Minoglou, K. / Rao, P. R. / Rahman, M. et al. | British Library Online Contents | 2011


    CMOS photodetection system with variable-time synchronous detection [5251-20]

    Pittet, P. / Lu, G.-N. / Pitaval, M. et al. | British Library Conference Proceedings | 2004