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    Titel :

    New optoelectronic methodology for nondestructive evaluation of MEMS at the wafer level [5265-12]



    Kongress:

    Conference, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology ; 2003 ; Providence, R.I



    Erscheinungsdatum :

    2004-01-01


    Format / Umfang :

    10 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Applied multifocus 3D microscopy [5265-19]

    Zamofing, T. / Hugli, H. / Society of Photo-optical Instrumentation Engineers | British Library Conference Proceedings | 2004


    Specular-reflection-based flatness tester [5265-13]

    Tang, S.-G. / Harding, K. G. / O Neil, G. et al. | British Library Conference Proceedings | 2004


    2D packing using the Myriad framework [5265-27]

    Chatburn, L. T. / Batchelor, B. G. / Society of Photo-optical Instrumentation Engineers | British Library Conference Proceedings | 2004


    Sonoluminescence bubble measurements using vision-based algorithms [5265-14]

    Hall, N. R. / Mackey, J. R. / Matula, T. J. et al. | British Library Conference Proceedings | 2004


    Camera performance considerations for automotive applications [5265-22]

    Miller, J. W. V. / Murphey, Y. L. / Khairallah, F. et al. | British Library Conference Proceedings | 2004