New optoelectronic methodology for nondestructive evaluation of MEMS at the wafer level [5265-12]
Conference, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology ; 2003 ; Providence, R.I
2004-01-01
10 pages
Aufsatz (Konferenz)
Englisch
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Applied multifocus 3D microscopy [5265-19]
British Library Conference Proceedings | 2004
|Specular-reflection-based flatness tester [5265-13]
British Library Conference Proceedings | 2004
|2D packing using the Myriad framework [5265-27]
British Library Conference Proceedings | 2004
|Sonoluminescence bubble measurements using vision-based algorithms [5265-14]
British Library Conference Proceedings | 2004
|Camera performance considerations for automotive applications [5265-22]
British Library Conference Proceedings | 2004
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