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    Titel :

    Distributed control and measurement system (DCS) preferable to design-for-testability (DfT) for analog ICs [5253-124]



    Kongress:

    International symposium; 5th, Instrumentation and control technology



    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    4 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Software design of distributed automatic testing system for UAV flight control system [5253-127]

    Zhong, Z. / Chen, X. / SPIE - The International Society for Optical Engineering | British Library Conference Proceedings | 2003


    Design of automatic test system software [5253-114]

    Xu, L. / Li, X. / SPIE - The International Society for Optical Engineering | British Library Conference Proceedings | 2003


    Research on C41 simulation in distributed simulation system [5253-179]

    Li, N. / Gong, G. / Peng, X. et al. | British Library Conference Proceedings | 2003


    Design optimization of compound pendulum system for measurement of microthrust [5253-59]

    Wang, Y. / Wang, B. / Liu, Z. et al. | British Library Conference Proceedings | 2003


    Real-time research on local monitoring station of distributed control system [5253-108]

    Li, M. / Huang, T. / Sun, T. et al. | British Library Conference Proceedings | 2003