Phase Characterisation of TiO~2 Thin Films using Micro-Raman Spectroscopy and Glancing Angle X-ray Diffraction
Conference, Optoelectronic and microelectronic materials and devices; COMMAD 2002 ; 2002 ; Sydney, Australia
2002-01-01
4 pages
IEEE cat no 02EX601
Aufsatz (Konferenz)
Englisch
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