AFM length analysis of data marks: measuring jitter, asymmetry, process noise, and process position [4342-72]
Topical meeting; 17th, Optical data storage ; 2001 ; Santa Fe, NM
2002-01-01
9 pages
Also known as ODS2001
Aufsatz (Konferenz)
Englisch
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DataCite | 1928
UV embossing process for multilayered waveguide holographic memory media [4342-06]
British Library Conference Proceedings | 2002
|Groove-only recording under DVR conditions [4342-48]
British Library Conference Proceedings | 2002
|Electron beam mastering system for mass data storage [4342-113]
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|Performance evaluation of asymmetrical run-length-limited code for optical disks [4342-27]
British Library Conference Proceedings | 2002
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