Surface profile measurement using a CD optical pickup head [4596-08]
Conference; 2nd, Advanced photonic sensors and applications ; 2000 ; Singapore
2001-01-01
6 pages
Aufsatz (Konferenz)
Englisch
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
DataCite | 1933
Thin films residual stress measurement by optical profilometry [4596-02]
British Library Conference Proceedings | 2001
|Simultaneous microstress and strain measurement with an optical microscope [4596-37]
British Library Conference Proceedings | 2001
|Multichannel 3D profilometry [4596-27]
British Library Conference Proceedings | 2001
|Dynamic phase-shift photoelasticity [4596-44]
British Library Conference Proceedings | 2001
|