2000-01-0054 Error Analysis of Curvature-Based Contour Measurement Devices
Session, Safety test methodologies ; 2000 ; Detroit, MI
2000-01-01
18 pages
Papers in the range 2000-01-0047 to 0610, with gaps. Held as part of the SAE 2000 World Congress
Aufsatz (Konferenz)
Englisch
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