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    Titel :

    Total profile distortion Z-scan (Invited Paper) [3572-36]



    Kongress:

    3rd, Iberoamerican optics meeting ; 1998 ; Cartagena de Indias; Colombia



    Erscheinungsdatum :

    1999-01-01


    Format / Umfang :

    10 pages


    Anmerkungen:

    Also known as III RIAO - OPTILAS'98




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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