Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    New method for measuring the thickness and shape of a thin film simultaneously by combining interferometry and laser triangulation [2861-30]



    Kongress:

    Conference; 8th, Laser interferometry VIII: applications ; 1996 ; Denver; CO



    Erscheinungsdatum :

    1996-01-01


    Format / Umfang :

    9 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Ultrahigh resolution interferometry (Invited Paper) [2861-18]

    Trolinger, J. D. / SPIE | British Library Conference Proceedings | 1996


    Novel material studies by automatic grating interferometry [2861-31]

    Salbut, L. A. / Kujawinska, M. / SPIE | British Library Conference Proceedings | 1996


    Nr. 2861

    DataCite | 1900


    Simple laser interferometers for testing optics [2861-44]

    Popov, E. G. / SPIE | British Library Conference Proceedings | 1996


    Moire tomography by ART [2861-21]

    Yan, D.-P. / Liu, F. / Wang, Z.-D. et al. | British Library Conference Proceedings | 1996